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tests: app_dev: ram_context_for_isr: fix irq_num
This commit fixes build issue when multi level interrupts is enabled, define TEST_IRQ_NUM as (CONFIG_2ND_LVL_ISR_TBL_OFFSET - 1) - CMSIS/Core/Include/core_cm33.h:2438:15: error: array subscript 24 is above array bounds of volatile uint32_t[16] Signed-off-by: Biwen Li <[email protected]>
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  • tests/application_development/ram_context_for_isr/include

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tests/application_development/ram_context_for_isr/include/fake_driver.h

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@@ -26,7 +26,12 @@ extern "C" {
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#else
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/* For all the other platforms, use the last available IRQ line for testing. */
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#ifdef CONFIG_MULTI_LEVEL_INTERRUPTS
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#define TEST_IRQ_NUM (CONFIG_2ND_LVL_ISR_TBL_OFFSET - 1)
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#else
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#define TEST_IRQ_NUM (CONFIG_NUM_IRQS - 1)
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#endif
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#define TEST_IRQ_PRIO 1
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#endif
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